Symposium on simultaneous measurements
of force and tunneling current in atomic scale
Recently, new experimental techniques based on a combination of atomic resolution STM with force microscopy have been introduced. However, a comprehensive understanding of the entire scanning process is still lacking and remains a challenge. The aim of the workshop is to gather leading scientists from the field of the SPM community to exchange ideas about the most pressing challenges and to discuss the next developments needed to anticipate the future of scanning probe techniques.
Scientific sessions start on Sunday 1st July 2012 and overlap with the nc-AFM 2012 conference starting on Monday 2nd July with several regular contributed talks and invited review talks.

Workshop participation is free if attending the main conference. We encourage your participation and look forward to meeting you in Ceský Krumlov. The workshop is supported financially by the European Science Foundation (ESF).
Ruben Pérez (Universidad Autónoma de Madrid)
Philip Moriarty (University of Nottingham)

Invited Speakers:
Richard Berndt (Universitaet Kiel)
Franz Giessibl (UniversitaetRegensburg)
Nicolas Lorente (Centro de Investigaciones en Nanociencia y Nanotecnologia)
Latha Venkataraman (Columbia University)
Yoshiaki Sugimoto (Osaka University)
Stefan Tautz (Julich Forschungszentrum)